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You searched for: mediatype:texts AND collection:theides AND subject:"BISR"
[texts]Built-in Self Repair for SRAM Array using Redundancy - A. Padma Sravani, Dr. M. Satyam
In this paper, a built-in self repair technique for word-oriented two-port SRAM memories is presented. The technique is implemented by additional hardware design instead of traditional software diagnostic procedures and the computation time is minimized. A built-in self-test (BIST) is used to detect the faulty locations which are isolated immediately after detection. Therefore, the redirection process can be executed as soon as possible...
Keywords: SRAM; two-port memories; PVT faults; fault isolation; BISR
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